NS-7000

This handler from Seiko-Epson offers high speed, precission and reliability.

Features

  • Wide Range of Flexible Socket Layouts
  • High throughput
  • Temperature chamber
  • Ability to test a wide range of devices including ultra-thin (through soft contact mode), small devices including MLP and MLF, and also CMOS image sensors and RF devices
  • Electro-pneumatic regulator to control contact force
  • SHort changeover time
  • Auto-teaching with auto-teaching jigs
  • ESD Reduction
  • Side-docking test head
  • CE Marking
  • Multi-lingual
In addition custom options include:

  • One-touch lock socket plate
  • High-contact pressure
  • Motor Rotator Hand
  • Wide hot plate
  • Cross sensors for improving the precision of device floating detection
  • Advanced tray handling