NS-8000 IC Test Handler

An excellent high throughput IC test handler with both ambient and high temperature test capabilities with the following features available:

High throughput - both 4 and 8 site testing
Wide range of device types including ultra thinn, small devices such as CSP and WLCSP and test of CMOS image sensors and RF devices
High Stiffness and low vibration
User-friendly
Visual operation window
Wide door opening for easy maintenance
Flexibile socket layout
Precise contact force control
Automatic teaching means accuracte teaching with only a few manual operations
ESD Safe
Side-docking test head
CE Marking
Compatible with the NS-6000 and NS-7000 through changeoveer kits
Multi-lingual

In addition to these features the NS-8000 offers options for: